“Cross-sectional transmission electron microscopy analysis of nanogap electrode fabricated by atomic force microscope local oxidation”
Rai Moriya, Eriko Ikenaga, Satoru Masubuchi, Tomoki Machida
Jpn. J. Appl. Phys. 52, 055201 (2013)
DOI: 10.7567/JJAP.52.055201