東京大学生産技術研究所 町田研究室

“Observation of finite excess noise in the voltage-biased quantum Hall regime as a precursor for breakdown”

K. Chida, T. Arakawa, S. Matsuo, Y. Nishihara, T. Tanaka, D. Chiba, T. Ono, T. Hata, K. Kobayashi, and T. Machida
Phys. Rev. B 87, 155313-1-7 (2013)
DOI: 10.1103/PhysRevB.87.155313